Valuable tips and how to deal with special cases in practical use
Specialities with the coating thickness measurement gauges of the Surfix®-models
PHYNIX GmbH & Co.KG Köln
Germany
2001

 

Abridgement from the index of contents:

Coating Thickness Measurement - the basics

1. What units do we use for coating thickness measurement?
2. Which combinations of coating and substrate can be measured with the magnetic and eddy-current principles?
3. How is the probe constructed and how does it work?
4. What must I remember when using the probe?

Calibration - the basics

1. Why and when must a coating thickness gauge be calibrated?
2. What does a coating thickness gauge show when it is not calibrated / not correctly calibrated?
3. Which applications are suitable for the three types of calibration of the Surfix® gauge?
4. What does drift compensation mean in coating thickness measurement?

Special cases

1. How does the geometry of the test sample influence test results?
2. How can (too) small test samples appear larger by artifical means?
3. When there is a multi-layer system (paint on paint on paint), how can I measure the top layer only?
4. With a multi-layer coating system, how can I measure individual layers of paint on zinc on steel non-destructively?
5. Rough substrates - problems and remedies.
6. What should I remember when measuring unusual coatings?
7. What effects does the electrical conductivity of the substrate (non-ferrous metal) have on test results?
8. What effect does the low magnetizability of steel have on test results?
9. What are the limits of the automatic substrate recognition 'AUTO FN'?
10. What are the effects on measurement of magnetic and electromagnetic noise fields?

Processing measured values 

1. What is the difference between resolution, repeatability and measuring uncertainty?
2. What are the effects of the probe characteristic?
3. How accurately can coating thickness be measured?
4. What kinds of memory do Surfix® gauges have?
5. What are the possibilities when measuring with set limits?
6. How can test data be transferred to peripheral equipment?

 

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